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Citation link: https://nbn-resolving.de/urn:nbn:de:gbv:46-00103179-13
00103179-1.pdf
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Testing of Reversible Circuits


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Other Titles: Test reversibler Schaltungen
Authors: Zhang, Hongyan 
Supervisor: Drechsler, Rolf  
1. Expert: Drechsler, Rolf  
Experts: Kreowski, Hans-Jörg  
Abstract: 
Reversible circuits rely on an entirely different computing paradigm allowing to perform computations not only from the primary inputs to the primary outputs but also vice versa. Recently, first physical realizations based on this paradigm have been introduced in the domain of quantum computation and low-power circuits. This puts key test challenges for the future on the table. This thesis contributes to efficient testing methods (Automatic Test Pattern Generation and fault diagnosis) for reversible circuits. Formal methods like Boolean satisfiability are exploited.
Keywords: reversible circuits; test; ATPG; fault diagnosis; SAT
Issue Date: 3-May-2013
Type: Dissertation
Secondary publication: no
URN: urn:nbn:de:gbv:46-00103179-13
Institution: Universität Bremen 
Faculty: Fachbereich 03: Mathematik/Informatik (FB 03) 
Appears in Collections:Dissertationen

  

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