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  4. Testing of Reversible Circuits
 
Zitierlink URN
https://nbn-resolving.de/urn:nbn:de:gbv:46-00103179-13

Testing of Reversible Circuits

Veröffentlichungsdatum
2013-05-03
Autoren
Zhang, Hongyan  
Betreuer
Drechsler, Rolf  
Gutachter
Kreowski, Hans-Jörg  
Zusammenfassung
Reversible circuits rely on an entirely different computing paradigm allowing to perform computations not only from the primary inputs to the primary outputs but also vice versa. Recently, first physical realizations based on this paradigm have been introduced in the domain of quantum computation and low-power circuits. This puts key test challenges for the future on the table. This thesis contributes to efficient testing methods (Automatic Test Pattern Generation and fault diagnosis) for reversible circuits. Formal methods like Boolean satisfiability are exploited.
Schlagwörter
reversible circuits

; 

test

; 

ATPG

; 

fault diagnosis

; 

SAT
Institution
Universität Bremen  
Fachbereich
Fachbereich 03: Mathematik/Informatik (FB 03)  
Dokumenttyp
Dissertation
Zweitveröffentlichung
Nein
Sprache
Englisch
Dateien
Lade...
Vorschaubild
Name

00103179-1.pdf

Size

652.5 KB

Format

Adobe PDF

Checksum

(MD5):61d08c9abd86ff3b899b5895b7b1a51e

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