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Citation link: https://doi.org/10.26092/elib/2301

Publisher DOI: https://doi.org/10.1109/TCAD.2008.923107
Drechsler-et-al_On_Acceleration_of_SAT-Based_ATPG_for_Industrial_Designs_2008_accepted-version_PDF-A-2b.pdf
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On Acceleration of SAT-Based ATPG for Industrial Designs


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Authors: Drechsler, Rolf  
Eggersglüß, Stephan 
Fey, Görschwin  
Glowatz, Andreas  
Hapke, Friedrich  
Schloeffel, Juergen 
Tille, Daniel 
Abstract: 
Due to the rapidly growing size of integrated circuits, there is a need for new algorithms for automatic test pattern generation (ATPG). While classical algorithms reach their limit, there have been recent advances in algorithms to solve Boolean Satisfiability (SAT). Because Boolean SAT solvers are working on conjunctive normal forms (CNFs), the problem has to be transformed. During transformation, relevant information about the problem might get lost and, therefore, is not available in the solving process. In this paper, we present a technique that applies structural knowledge about the circuit during the transformation. As a result, the size of the problem instances decreases, as well as the run time of the ATPG process. The technique was implemented, and experimental results are presented. The approach was combined with the ATPG framework of NXP Semiconductors. It is shown that the overall performance of an industrial framework can significantly be improved. Further experiments show the benefits with regard to the efficiency and robustness of the combined approach.
Keywords: Automatic test pattern generation; Boolean satisfiability; Formal methods; Testing
Issue Date: 17-Jun-2008
Publisher: IEE
Journal/Edited collection: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 
Start page: 1329
End page: 1333
Note: 7
Band: 27
Type: Artikel/Aufsatz
ISSN: 0278-0070
Secondary publication: yes
Document version: Postprint
DOI: 10.26092/elib/2301
URN: urn:nbn:de:gbv:46-elib69803
Faculty: Fachbereich 03: Mathematik/Informatik (FB 03) 
Appears in Collections:Forschungsdokumente

  

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