On Acceleration of SAT-Based ATPG for Industrial Designs
Veröffentlichungsdatum
2008-06-17
Zusammenfassung
Due to the rapidly growing size of integrated circuits, there is a need for new algorithms for automatic test pattern generation (ATPG). While classical algorithms reach their limit, there have been recent advances in algorithms to solve Boolean Satisfiability (SAT). Because Boolean SAT solvers are working on conjunctive normal forms (CNFs), the problem has to be transformed. During transformation, relevant information about the problem might get lost and, therefore, is not available in the solving process. In this paper, we present a technique that applies structural knowledge about the circuit during the transformation. As a result, the size of the problem instances decreases, as well as the run time of the ATPG process. The technique was implemented, and experimental results are presented. The approach was combined with the ATPG framework of NXP Semiconductors. It is shown that the overall performance of an industrial framework can significantly be improved. Further experiments show the benefits with regard to the efficiency and robustness of the combined approach.
Schlagwörter
Automatic test pattern generation
;
Boolean satisfiability
;
Formal methods
;
Testing
Verlag
IEE
Fachbereich
Dokumenttyp
Artikel/Aufsatz
Zeitschrift/Sammelwerk
Band
27
Heft
7
Startseite
1329
Endseite
1333
Zweitveröffentlichung
Ja
Dokumentversion
Postprint
Lizenz
Sprache
Englisch
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Drechsler-et-al_On_Acceleration_of_SAT-Based_ATPG_for_Industrial_Designs_2008_accepted-version_PDF-A-2b.pdf
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886.03 KB
Format
Adobe PDF
Checksum
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