DEM simulation of rearrangement and detachment events during the AFM tip retraction from a nanoparticle film.

Abstract

Discrete element method simulation of the rearrangement and detachment events during the retraction of an AFM tip from a nanoparticle film. The left side shows the particle trajectory during the simulation, while the right side shows the z-forces simultaneously measured at the tip. Differently coloured particles represent different particle sizes.