DEM simulation of rearrangement and detachment events during the AFM tip retraction from a nanoparticle film.
Discrete element method simulation of the rearrangement and detachment events during the retraction of an AFM tip from a nanoparticle film. The left side shows the particle trajectory during the simulation, while the right side shows the z-forces simultaneously measured at the tip. Differently coloured particles represent different particle sizes.
|Type:||Video||URN:||urn:nbn:de:gbv:46-00106095-14||Institution:||Universität Bremen||Faculty:||FB4 Produktionstechnik|
|Appears in Collections:||Forschungsdokumente|
checked on Sep 29, 2020
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