DEM simulation of rearrangement and detachment events during the AFM tip retraction from a nanoparticle film.
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00106095-1.mp4 | 1.63 MB | Unknown | View/Open |
Authors: | Laube, Jens ![]() |
Abstract: | Discrete element method simulation of the rearrangement and detachment events during the retraction of an AFM tip from a nanoparticle film. The left side shows the particle trajectory during the simulation, while the right side shows the z-forces simultaneously measured at the tip. Differently coloured particles represent different particle sizes. |
Type: | Video | Secondary publication: | no | URN: | urn:nbn:de:gbv:46-00106095-14 | Institution: | Universität Bremen | Faculty: | Fachbereich 04: Produktionstechnik, Maschinenbau & Verfahrenstechnik (FB 04) |
Appears in Collections: | Forschungsdokumente |
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