DEM simulation of rearrangement and detachment events during the AFM tip retraction from a nanoparticle film.
Autoren
Zusammenfassung
Discrete element method simulation of the rearrangement and detachment events during the retraction of an AFM tip from a nanoparticle film. The left side shows the particle trajectory during the simulation, while the right side shows the z-forces simultaneously measured at the tip. Differently coloured particles represent different particle sizes.
Institution
Dokumenttyp
Video
Zweitveröffentlichung
Nein
Sprache
Deutsch
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Name
00106095-1.mp4
Size
1.6 MB
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Unknown
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(MD5):d89be065fc3620069dd24cd350c54a15