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  4. DEM simulation of rearrangement and detachment events during the AFM tip retraction from a nanoparticle film.
 
Zitierlink URN
https://nbn-resolving.de/urn:nbn:de:gbv:46-00106095-14

DEM simulation of rearrangement and detachment events during the AFM tip retraction from a nanoparticle film.

Autoren
Laube, Jens  
Zusammenfassung
Discrete element method simulation of the rearrangement and detachment events during the retraction of an AFM tip from a nanoparticle film. The left side shows the particle trajectory during the simulation, while the right side shows the z-forces simultaneously measured at the tip. Differently coloured particles represent different particle sizes.
Institution
Universität Bremen  
Fachbereich
Fachbereich 04: Produktionstechnik, Maschinenbau & Verfahrenstechnik (FB 04)  
Dokumenttyp
Video
Zweitveröffentlichung
Nein
Sprache
Deutsch
Dateien
Lade...
Vorschaubild
Name

00106095-1.mp4

Size

1.6 MB

Format

Unknown

Checksum

(MD5):d89be065fc3620069dd24cd350c54a15

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