DEM simulation of an AFM experiment on a nanoparticle film
Discrete element method simulation of an atomic force microscopy experiment on a nanoparticle film. The left side shows the particle trajectory during the tip (red pyramid) penetration, while the right side shows the force in z-direction simultaneously measured at the tip. The curve is shifted along the x-axis to meet the setpoint close to 0.
|Type:||Video||URN:||urn:nbn:de:gbv:46-00106094-13||Institution:||Universität Bremen||Faculty:||FB4 Produktionstechnik|
|Appears in Collections:||Forschungsdokumente|
checked on Sep 24, 2020
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