DEM simulation of rearrangement and detachment events during the AFM tip retraction from a nanoparticle film.

Laube, JensJensLaube2020-03-252020-03-25https://media.suub.uni-bremen.de/handle/elib/3354Discrete element method simulation of the rearrangement and detachment events during the retraction of an AFM tip from a nanoparticle film. The left side shows the particle trajectory during the simulation, while the right side shows the z-forces simultaneously measured at the tip. Differently coloured particles represent different particle sizes.deinfo:eu-repo/semantics/openAccess620DEM simulation of rearrangement and detachment events during the AFM tip retraction from a nanoparticle film.Videourn:nbn:de:gbv:46-00106095-14