Speckle pattern modulation for high-resolution displacement measurements
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Schweickhardt et al_Speckle pattern modulation for high-resolution displacement measurements_2021_published-version.pdf | 4.43 MB | Adobe PDF | View/Open |
Authors: | Schweickhardt, León ![]() Tausendfreund, Andreas ![]() Stöbener, Dirk ![]() Fischer, Andreas ![]() |
Abstract: | For digital image speckle correlation (DISC), a novel approach is introduced where an ensemble average over multiple different speckle patterns is calculated. As a result, the measurement uncertainty of the displacement is reduced by an order of magnitude without deteriorating the spatial resolution. This enables precise surface displacement field measurements in the micrometer range with a measurement uncertainty lower than 100nm at a spatial resolution below 20 μm. By using a digital micromirror device (DMD) for illumination modulation, measuring rates in the range of 25 Hz are possible while each measurement is based on 80 images. |
Keywords: | Speckle pattern; Diffusers; Modulation; Spatial resolution; Digital micromirror devices; Speckle; Digital image correlation | Issue Date: | 20-Jun-2021 | Publisher: | Society of Photo‑Optical Instrumentation Engineers (SPIE) | Journal/Edited collection: | Proceedings Volume 11782, Optical Measurement Systems for Industrial Inspection XII | Type: | Konferenzbeitrag | Conference: | SPIE Optical Metrology, 2021 | Secondary publication: | yes | Document version: | Published Version | DOI: | 10.26092/elib/3654 | URN: | urn:nbn:de:gbv:46-elib87360 | Institution: | Universität Bremen | Faculty: | Fachbereich 04: Produktionstechnik, Maschinenbau & Verfahrenstechnik (FB 04) Zentrale Wissenschaftliche Einrichtungen und Kooperationen |
Institute: | Bremer Institut für Messtechnik, Automatisierung und Qualitätswissenschaft (BIMAQ) MAPEX Center for Materials and Processes |
Appears in Collections: | Forschungsdokumente |
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