Improving Security for Elliptic Curve Implementations on Smart Cards: A Random Number Generator Test Unit
| File | Description | Size | Format | |
|---|---|---|---|---|
| 00010630.pdf | 1.27 MB | Adobe PDF | View/Open |
| Other Titles: | Verbessern der Sicherheit für elliptische Kurve Implementierungen auf Smart Cards: Ein Zufallszahlengenerator-Testeinheit | Authors: | Weigl, Andrew | Supervisor: | Anheier, Walter | 1. Expert: | Anheier, Walter | Experts: | Laur, Rainer | Abstract: | We present a new random number gernator test unit for smart cards that has the same test quality (for the error types studied) as a test unit following the FIPS 140-2 standard, but with lower hardware characteristics and requires a short sample sequence. |
Keywords: | Random Number Generator; Testing; RNG; FIPS 140-2; Smart Card | Issue Date: | 24-Jul-2006 | Type: | Dissertation | Secondary publication: | no | URN: | urn:nbn:de:gbv:46-diss000106308 | Institution: | Universität Bremen | Faculty: | Fachbereich 01: Physik/Elektrotechnik (FB 01) |
| Appears in Collections: | Dissertationen |
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